P_2x3T_135_A

Production testing

Date:3/29/2007

Operator: Joseph Clampitt

start testing time:11:51 AM

Sensor: S_2x3T_13, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W36_XD4K3LT32A
ROC1W36_XD4K3LT31A
ROC2W36_XD4K3LT30D
ROC3W36_XD4K3LT51D
ROC4W36_XD4K3LT52C
ROC5W36_XD4K3LT52D

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 132 132 130 124 148 150
Vana, VanaData 131 142 132 131 151 132
CalDelData and plots7991911007884
VthrCompData and plots808270658675
TestDdata ,TestD Plots400100
LightData ,Light Plots400000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe9595859095115
Vsf140140135140145140
VoffsetOp7095758010075
VIbias_PH95100100100100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.013799

SIGMA = 0.398208
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.598772

SIGMA = 0.367010
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.974846

SIGMA = 0.385901
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.387265

SIGMA = 0.342821
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.573429

SIGMA = 0.349769
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.623968

SIGMA = 0.340559

Comment (if any): Good

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:10 PM