P_2x3T_067

P_2x3T_067_A

Production testing

Date:2/20/2007

Operator: Joseph Clampitt

start testing time:11:46 AM

Sensor: S_2x3T_06, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W29_X64K5ST 17A

ROC1 W29_X64K5ST 16D

ROC2 W29_X64K5ST 16C

ROC3 W33_XC4K5LT 64D

ROC4 W33_XC4K5LT 65B

ROC5 W33_XC4K5LT 65C

ROC	ROC wafer	Label
ROC0	W29_X64K5ST	17A
ROC1	W29_X64K5ST	16D
ROC2	W29_X64K5ST	16C
ROC3	W33_XC4K5LT	64D
ROC4	W33_XC4K5LT	65B
ROC5	W33_XC4K5LT	65C

Depletion Voltage is -48 and suggested operational voltage is -88

Ibias_DAC, Ibias_DAC Data 134 126 140 132 130 134

Vana, VanaData 137 125 134 145 123 122

CalDelData and plots 78 73 66 75 95 85

VthrCompData and plots 79 74 80 80 72 66

TestDdata ,TestD Plots 1 0 0 40 73 48

LightData ,Light Plots 0 0 0 0 3 0

Pass/Fail TestD GOOD GOOD GOOD GOOD BAD BAD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	105	135	115	95	130	120
Vsf	140	135	135	140	140	135
VoffsetOp	75	70	80	85	90	55
VIbias_PH	105	105	100	100	100	100

ROC0 NOISE			MEAN = 5.352113 SIGMA = 0.417531
ROC1 NOISE			MEAN = 5.217094 SIGMA = 0.396568
ROC2 NOISE			MEAN = 4.567310 SIGMA = 0.341261
ROC3 NOISE			MEAN = 4.832393 SIGMA = 0.383378
ROC4 NOISE			MEAN = 5.110378 SIGMA = 0.406717
ROC5 NOISE			MEAN = 5.150055 SIGMA = 0.387295

Comment (if any): Good

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:06 PM

Ibias_DAC, Ibias_DAC Data	134	126	140	132	130	134
Vana, VanaData	137	125	134	145	123	122
CalDelData and plots	78	73	66	75	95	85
VthrCompData and plots	79	74	80	80	72	66
TestDdata ,TestD Plots	1	0	0	40	73	48
LightData ,Light Plots	0	0	0	0	3	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	BAD	BAD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD