P_2x3T_056

P_2x3T_056_C

Production testing

Date:6/18/2007

Operator: Emily Grace

start testing time:10:04 AM

Sensor: S_2x3T_05, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 KZNG1JT 67B

ROC1 KZNG1JT 68D

ROC2 KZNG1JT 58B

ROC3 KZNG1JT 28D

ROC4 KZNG1JT 58C

ROC5 KZNG1JT 39B

ROC	ROC wafer	Label
ROC0	KZNG1JT	67B
ROC1	KZNG1JT	68D
ROC2	KZNG1JT	58B
ROC3	KZNG1JT	28D
ROC4	KZNG1JT	58C
ROC5	KZNG1JT	39B

Depletion Voltage is -40 and suggested operational voltage is -80

Ibias_DAC, Ibias_DAC Data 170 154 154 162 164 154

Vana, VanaData 122 138 127 143 147 142

CalDelData and plots 72 86 70 75 80 67

VthrCompData and plots 69 80 83 80 86 87

TestDdata ,TestD Plots 160 0 7 1 0 6

LightData ,Light Plots 79 0 14 3 0 14

Pass/Fail TestD BAD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT BAD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	45	100	110	90	90	95
Vsf	165	140	140	145	145	140
VoffsetOp	240	85	75	80	95	95
VIbias_PH	145	100	100	105	105	105

ROC0 NOISE			MEAN = 4.525757 SIGMA = 0.360252
ROC1 NOISE			MEAN = 4.082725 SIGMA = 0.318067
ROC2 NOISE			MEAN = 4.457532 SIGMA = 0.382143
ROC3 NOISE			MEAN = 4.394796 SIGMA = 0.357156
ROC4 NOISE			MEAN = 4.109209 SIGMA = 0.334668
ROC5 NOISE			MEAN = 4.514115 SIGMA = 0.354299

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 10:29 AM

Ibias_DAC, Ibias_DAC Data	170	154	154	162	164	154
Vana, VanaData	122	138	127	143	147	142
CalDelData and plots	72	86	70	75	80	67
VthrCompData and plots	69	80	83	80	86	87
TestDdata ,TestD Plots	160	0	7	1	0	6
LightData ,Light Plots	79	0	14	3	0	14
Pass/Fail TestD	BAD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	BAD	GOOD	GOOD	GOOD	GOOD	GOOD