P_2x3T_050

P_2x3T_050_C

Production testing

Date:2/23/2007

Operator: Isaac Childres

start testing time:2:04 PM

Sensor: S_2x3T_05, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XG4KFCT 63D

ROC1 XG4KFCT 63C

ROC2 XG4KFCT 62D

ROC3 XG4KFCT 57B

ROC4 XG4KFCT 61D

ROC5 XG4KFCT 62C

ROC	ROC wafer	Label
ROC0	XG4KFCT	63D
ROC1	XG4KFCT	63C
ROC2	XG4KFCT	62D
ROC3	XG4KFCT	57B
ROC4	XG4KFCT	61D
ROC5	XG4KFCT	62C

Depletion Voltage is -42 and suggested operational voltage is -82

Ibias_DAC, Ibias_DAC Data 144 138 138 132 128 126

Vana, VanaData 147 153 133 120 127 114

CalDelData and plots 76 97 94 79 80 100

VthrCompData and plots 87 86 83 79 63 64

TestDdata ,TestD Plots 0 0 0 0 1 6

LightData ,Light Plots 2 0 0 4 3 4

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	105	95	120	155	105	160
Vsf	145	150	140	135	140	130
VoffsetOp	85	105	85	80	75	65
VIbias_PH	100	105	95	105	95	105

ROC0 NOISE			MEAN = 4.760102 SIGMA = 0.379055
ROC1 NOISE			MEAN = 4.828784 SIGMA = 0.373632
ROC2 NOISE			MEAN = 4.614401 SIGMA = 0.369623
ROC3 NOISE			MEAN = 4.890186 SIGMA = 0.386458
ROC4 NOISE			MEAN = 4.854833 SIGMA = 0.374394
ROC5 NOISE			MEAN = 5.617273 SIGMA = 0.433654

Comment (if any): Test D found a couple of bad bumps near the encapped edge of ROC5, similar to patterns found during the first encapping tests.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 2:23 PM

Ibias_DAC, Ibias_DAC Data	144	138	138	132	128	126
Vana, VanaData	147	153	133	120	127	114
CalDelData and plots	76	97	94	79	80	100
VthrCompData and plots	87	86	83	79	63	64
TestDdata ,TestD Plots	0	0	0	0	1	6
LightData ,Light Plots	2	0	0	4	3	4
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD