P_2x3T_048

P_2x3T_048_C

Production testing

Date:3/1/2007

Operator: Isaac Childres

start testing time:4:40 PM

Sensor: S_2x3T_04, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XG4KFCT 25B

ROC1 XG4KFCT 25A

ROC2 XG4KFCT 24B

ROC3 XG4KFCT 20B

ROC4 XG4KFCT 21A

ROC5 XG4KFCT 22B

ROC	ROC wafer	Label
ROC0	XG4KFCT	25B
ROC1	XG4KFCT	25A
ROC2	XG4KFCT	24B
ROC3	XG4KFCT	20B
ROC4	XG4KFCT	21A
ROC5	XG4KFCT	22B

Depletion Voltage is -44 and suggested operational voltage is -84

Ibias_DAC, Ibias_DAC Data 134 144 142 138 122 124

Vana, VanaData 132 147 122 116 127 134

CalDelData and plots 92 84 90 94 85 79

VthrCompData and plots 71 85 66 63 85 80

TestDdata ,TestD Plots 1 0 0 3 987 0

LightData ,Light Plots 6 0 0 8 4 2

Pass/Fail TestD GOOD GOOD GOOD GOOD BAD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	100	90	170	120	135	130
Vsf	135	145	135	125	135	140
VoffsetOp	80	90	55	65	55	65
VIbias_PH	105	100	95	100	100	95

ROC0 NOISE			MEAN = 5.505597 SIGMA = 0.422260
ROC1 NOISE			MEAN = 4.739480 SIGMA = 0.373795
ROC2 NOISE			MEAN = 4.984371 SIGMA = 0.404377
ROC3 NOISE			MEAN = 4.511840 SIGMA = 0.343982
ROC4 NOISE			MEAN = 5.716493 SIGMA = 0.437986
ROC5 NOISE			MEAN = 5.186166 SIGMA = 0.392945

Comment (if any): Okay.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 4:59 PM

Ibias_DAC, Ibias_DAC Data	134	144	142	138	122	124
Vana, VanaData	132	147	122	116	127	134
CalDelData and plots	92	84	90	94	85	79
VthrCompData and plots	71	85	66	63	85	80
TestDdata ,TestD Plots	1	0	0	3	987	0
LightData ,Light Plots	6	0	0	8	4	2
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	BAD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD