P_2x3T_046_A

Production testing

Date:5/24/2007

Operator: Emily Grace

start testing time:3:14 PM

Sensor: S_2x3T_04, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W36_XD4K3LT17C
ROC1W36_XD4K3LT17B
ROC2W36_XD4K3LT17A
ROC3W49_D1LQGST18A
ROC4W49_D1LQGST03B
ROC5W49_D1LQGST03D

Depletion Voltage is -42 and suggested operational voltage is -82
Ibias_DAC, Ibias_DAC Data 154 154 156 160 152 156
Vana, VanaData 135 114 141 150 144 153
CalDelData and plots1019689738889
VthrCompData and plots838375898888
TestDdata ,TestD Plots010102
LightData ,Light Plots000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe12515010010010095
Vsf140135140155145150
VoffsetOp807085105110110
VIbias_PH10010510510095105
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.141287

SIGMA = 0.345736
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.690259

SIGMA = 0.352285
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.163187

SIGMA = 0.346904
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 3.946873

SIGMA = 0.317687
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 3.887312

SIGMA = 0.291112
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.392705

SIGMA = 0.354736

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 3:41 PM