P_2x3T_040

P_2x3T_040_A

Production testing

Date:5/22/2007

Operator: Emily Grace

start testing time:3:45 PM

Sensor: S_2x3T_04, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W36_XD4K3LT 15A

ROC1 W35_XH4K3HT 51B

ROC2 W35_XH4K3HT 51A

ROC3 W36_XD4K3LT 27C

ROC4 W36_XD4K3LT 27D

ROC5 W33_XC4K5LT 04D

ROC	ROC wafer	Label
ROC0	W36_XD4K3LT	15A
ROC1	W35_XH4K3HT	51B
ROC2	W35_XH4K3HT	51A
ROC3	W36_XD4K3LT	27C
ROC4	W36_XD4K3LT	27D
ROC5	W33_XC4K5LT	04D

Depletion Voltage is -50 and suggested operational voltage is -90

Ibias_DAC, Ibias_DAC Data 160 134 158 146 150 156

Vana, VanaData 121 132 111 132 127 131

CalDelData and plots 85 86 92 89 84 82

VthrCompData and plots 73 68 69 77 73 79

TestDdata ,TestD Plots 0 1 0 4 0 0

LightData ,Light Plots 1 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	170	125	140	120	135	115
Vsf	135	140	135	140	135	140
VoffsetOp	70	55	65	85	65	95
VIbias_PH	100	95	95	95	95	100

ROC0 NOISE			MEAN = 4.044572 SIGMA = 0.322689
ROC1 NOISE			MEAN = 4.772579 SIGMA = 0.396249
ROC2 NOISE			MEAN = 4.472026 SIGMA = 0.359209
ROC3 NOISE			MEAN = 4.544313 SIGMA = 0.360307
ROC4 NOISE			MEAN = 4.653758 SIGMA = 0.383502
ROC5 NOISE			MEAN = 4.352789 SIGMA = 0.362062

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 4:12 PM

Ibias_DAC, Ibias_DAC Data	160	134	158	146	150	156
Vana, VanaData	121	132	111	132	127	131
CalDelData and plots	85	86	92	89	84	82
VthrCompData and plots	73	68	69	77	73	79
TestDdata ,TestD Plots	0	1	0	4	0	0
LightData ,Light Plots	1	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD