P_2x3T_030_A

Production testing

Date:4/25/2007

Operator: Cameron McKinney

start testing time:12:38 PM

Sensor: S_2x3T_03, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W35_XH4K3HT29B
ROC1W35_XH4K3HT29A
ROC2W35_XH4K3HT28A
ROC3W35_XH4K3HT30C
ROC4W35_XH4K3HT31A
ROC5W35_XH4K3HT31B

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 138 144 140 122 160 144
Vana, VanaData 135 129 124 111 134 141
CalDelData and plots758795897091
VthrCompData and plots817475558970
TestDdata ,TestD Plots200002
LightData ,Light Plots000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe125120150125125110
Vsf140140145125140140
VoffsetOp85908050110100
VIbias_PH1009510595100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.983739

SIGMA = 0.393608
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.253348

SIGMA = 0.315558
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.574559

SIGMA = 0.357166
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 5.460044

SIGMA = 0.451440
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.117050

SIGMA = 0.329126
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.605998

SIGMA = 0.357424

Comment (if any): Good.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:57 PM