P_2x3T_014

P_2x3T_014_C

Production testing

Date:2/12/2007

Operator: Isaac Childres

start testing time:1:14 PM

Sensor: S_2x3T_01, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XE4K3KT 22B

ROC1 XE4K3KT 23A

ROC2 XE4K3KT 23B

ROC3 XE4K3KT 25A

ROC4 XE4K3KT 24B

ROC5 XE4K3KT 24A

ROC	ROC wafer	Label
ROC0	XE4K3KT	22B
ROC1	XE4K3KT	23A
ROC2	XE4K3KT	23B
ROC3	XE4K3KT	25A
ROC4	XE4K3KT	24B
ROC5	XE4K3KT	24A

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 130 126 130 130 140 128

Vana, VanaData 126 118 123 137 129 138

CalDelData and plots 73 90 82 81 88 93

VthrCompData and plots 76 63 73 75 74 65

TestDdata ,TestD Plots 1 1 0 0 0 0

LightData ,Light Plots 0 0 2 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

ROC0 NOISE			MEAN = 4.231510 SIGMA = 0.321073
ROC1 NOISE			MEAN = 3.938491 SIGMA = 0.297759
ROC2 NOISE			MEAN = 4.079859 SIGMA = 0.301075
ROC3 NOISE			MEAN = 4.668569 SIGMA = 0.351437
ROC4 NOISE			MEAN = 4.757841 SIGMA = 0.374013
ROC5 NOISE			MEAN = 4.762655 SIGMA = 0.363140

Comment (if any): Okay.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 1:30 PM

Ibias_DAC, Ibias_DAC Data	130	126	130	130	140	128
Vana, VanaData	126	118	123	137	129	138
CalDelData and plots	73	90	82	81	88	93
VthrCompData and plots	76	63	73	75	74	65
TestDdata ,TestD Plots	1	1	0	0	0	0
LightData ,Light Plots	0	0	2	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD