P_2x3B_182_A

Production testing

Date:2/16/2007

Operator: Cameron McKinney

start testing time:11:57 AM

Sensor: S_2x3B_18, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W28_X54K5TT13A
ROC1W28_X54K5TT12D
ROC2W28_X54K5TT12C
ROC3W29_X64K5ST66C
ROC4W29_X64K5ST67B
ROC5W29_X64K5ST67C

Depletion Voltage is -48 and suggested operational voltage is -88
Ibias_DAC, Ibias_DAC Data 142 134 124 144 138 128
Vana, VanaData 124 126 127 132 133 128
CalDelData and plots827999808476
VthrCompData and plots736763817088
TestDdata ,TestD Plots000000
LightData ,Light Plots000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe14011512011595125
Vsf135140140140140140
VoffsetOp85857510011590
VIbias_PH105100100100100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.926076

SIGMA = 0.391405
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.496288

SIGMA = 0.355883
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.841294

SIGMA = 0.375982
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.277427

SIGMA = 0.330450
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.640959

SIGMA = 0.391117
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.757750

SIGMA = 0.389304

Comment (if any): OK

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:25 PM