P_2x3B_181_C

Production testing

Date:5/16/2007

Operator: Emily Grace

start testing time:3:17 PM

Sensor: S_2x3B_18, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0KBNG0QT67B
ROC1KBNG0QT67A
ROC2KBNG0QT67D
ROC3KBNG0QT27D
ROC4KBNG0QT18A
ROC5KBNG0QT28D

Depletion Voltage is -52 and suggested operational voltage is -92
Ibias_DAC, Ibias_DAC Data 144 164 160 156 146 162
Vana, VanaData 133 139 146 145 134 144
CalDelData and plots868378817398
VthrCompData and plots737977868779
TestDdata ,TestD Plots000111
LightData ,Light Plots000001
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe10090909011090
Vsf135145145145140145
VoffsetOp6010095958090
VIbias_PH100100100100105105
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.711850

SIGMA = 0.363773
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 3.837123

SIGMA = 0.305785
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.381872

SIGMA = 0.352928
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.189213

SIGMA = 0.344079
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.651317

SIGMA = 0.376479
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.189527

SIGMA = 0.342794

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 3:42 PM