P_2x3B_166

P_2x3B_166_C

Production testing

Date:3/23/2007

Operator: Isaac Childres

start testing time:1:18 PM

Sensor: S_2x3B_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XG4KFCT 05A

ROC1 XG4KFCT 04B

ROC2 XG4KFCT 04A

ROC3 XG4KFCT 03B

ROC4 XG4KFCT 03A

ROC5 XG4KFCT 06D

ROC	ROC wafer	Label
ROC0	XG4KFCT	05A
ROC1	XG4KFCT	04B
ROC2	XG4KFCT	04A
ROC3	XG4KFCT	03B
ROC4	XG4KFCT	03A
ROC5	XG4KFCT	06D

Depletion Voltage is -50 and suggested operational voltage is -90

Ibias_DAC, Ibias_DAC Data 130 122 128 144 122 142

Vana, VanaData 124 116 127 140 110 118

CalDelData and plots 85 84 89 73 104 80

VthrCompData and plots 76 78 73 80 70 77

TestDdata ,TestD Plots 2 1 0 3 0 0

LightData ,Light Plots 1 0 0 4 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	115	130	135	100	155	145
Vsf	140	135	135	140	130	140
VoffsetOp	70	80	75	100	80	80
VIbias_PH	95	105	105	95	95	105

ROC0 NOISE			MEAN = 4.751540 SIGMA = 0.382914
ROC1 NOISE			MEAN = 5.645691 SIGMA = 0.448977
ROC2 NOISE			MEAN = 5.017301 SIGMA = 0.385763
ROC3 NOISE			MEAN = 4.534575 SIGMA = 0.341284
ROC4 NOISE			MEAN = 5.070336 SIGMA = 0.393319
ROC5 NOISE			MEAN = 5.220213 SIGMA = 0.398810

Comment (if any): Good.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 1:35 PM

Ibias_DAC, Ibias_DAC Data	130	122	128	144	122	142
Vana, VanaData	124	116	127	140	110	118
CalDelData and plots	85	84	89	73	104	80
VthrCompData and plots	76	78	73	80	70	77
TestDdata ,TestD Plots	2	1	0	3	0	0
LightData ,Light Plots	1	0	0	4	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD