P_2x3B_163

P_2x3B_163_C

Production testing

Date:5/8/2007

Operator: Petra Merkel

start testing time:11:32 PM

Sensor: S_2x3B_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 KNN0GDT 21B

ROC1 KNN0GDT 52B

ROC2 KNN0GDT 62A

ROC3 KNN0GDT 52D

ROC4 KNN0GDT 11B

ROC5 KNN0GDT 11C

ROC	ROC wafer	Label
ROC0	KNN0GDT	21B
ROC1	KNN0GDT	52B
ROC2	KNN0GDT	62A
ROC3	KNN0GDT	52D
ROC4	KNN0GDT	11B
ROC5	KNN0GDT	11C

Depletion Voltage is -42 and suggested operational voltage is -82

Ibias_DAC, Ibias_DAC Data 138 130 154 140 150 148

Vana, VanaData 145 121 139 131 127 150

CalDelData and plots 73 93 71 81 84 65

VthrCompData and plots 84 66 82 83 73 92

TestDdata ,TestD Plots 1 0 1 1 0 144

LightData ,Light Plots 0 0 0 1 0 156

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD BAD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD BAD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	100	135	95	115	125	95
Vsf	145	135	140	140	135	145
VoffsetOp	90	65	95	85	75	100
VIbias_PH	105	95	105	100	100	100

ROC0 NOISE			MEAN = 4.728224 SIGMA = 0.375958
ROC1 NOISE			MEAN = 4.827517 SIGMA = 0.386637
ROC2 NOISE			MEAN = 4.444544 SIGMA = 0.349712
ROC3 NOISE			MEAN = 4.790742 SIGMA = 0.373824
ROC4 NOISE			MEAN = 4.658898 SIGMA = 0.367949
ROC5 NOISE			MEAN = 4.280925 SIGMA = 0.341296

Comment (if any): ROC5 has triangular shaped bad bump pattern similar to what we've seen during the pilot run.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:51 PM

Ibias_DAC, Ibias_DAC Data	138	130	154	140	150	148
Vana, VanaData	145	121	139	131	127	150
CalDelData and plots	73	93	71	81	84	65
VthrCompData and plots	84	66	82	83	73	92
TestDdata ,TestD Plots	1	0	1	1	0	144
LightData ,Light Plots	0	0	0	1	0	156
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	BAD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	BAD