P_2x3B_152_A

Production testing

Date:3/5/2007

Operator: Cameron McKinney

start testing time:3:30 PM

Sensor: S_2x3B_15, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W34_XA4K3PT65C
ROC1W34_XA4K3PT64D
ROC2W34_XA4K3PT64C
ROC3W34_XA4K3PT45B
ROC4W34_XA4K3PT45D
ROC5W34_XA4K3PT46A

Depletion Voltage is -48 and suggested operational voltage is -88
Ibias_DAC, Ibias_DAC Data 144 146 154 138 142 134
Vana, VanaData 120 131 135 112 141 127
CalDelData and plots798480979488
VthrCompData and plots777589677580
TestDdata ,TestD Plots000000
LightData ,Light Plots416041604160416041604160
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT BAD BAD BAD BAD BAD BAD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe130110115150110140
Vsf130140140135140140
VoffsetOp708095809095
VIbias_PH100105100100100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.492647

SIGMA = 0.348306
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.278296

SIGMA = 0.383183
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.359199

SIGMA = 0.344764
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.421671

SIGMA = 0.358766
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.632736

SIGMA = 0.370862
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.615291

SIGMA = 0.360114

Comment (if any): User error.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 3:49 PM