P_2x3B_141

P_2x3B_141_A

Production testing

Date:3/23/2007

Operator: Cameron McKinney

start testing time:10:58 AM

Sensor: S_2x3B_14, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W36_XD4K3LT 47A

ROC1 W36_XD4K3LT 46C

ROC2 W36_XD4K3LT 45C

ROC3 W36_XD4K3LT 63B

ROC4 W36_XD4K3LT 63D

ROC5 W36_XD4K3LT 64A

ROC	ROC wafer	Label
ROC0	W36_XD4K3LT	47A
ROC1	W36_XD4K3LT	46C
ROC2	W36_XD4K3LT	45C
ROC3	W36_XD4K3LT	63B
ROC4	W36_XD4K3LT	63D
ROC5	W36_XD4K3LT	64A

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 150 134 142 134 134 128

Vana, VanaData 142 112 124 137 127 140

CalDelData and plots 84 96 89 84 89 87

VthrCompData and plots 81 66 67 73 71 80

TestDdata ,TestD Plots 0 0 25 0 0 0

LightData ,Light Plots 0 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	110	145	115	115	125	120
Vsf	145	140	135	135	140	145
VoffsetOp	105	60	85	85	65	70
VIbias_PH	100	105	100	100	105	100

ROC0 NOISE			MEAN = 4.178582 SIGMA = 0.314152
ROC1 NOISE			MEAN = 5.080920 SIGMA = 0.392675
ROC2 NOISE			MEAN = 4.543464 SIGMA = 0.363929
ROC3 NOISE			MEAN = 4.995187 SIGMA = 0.382811
ROC4 NOISE			MEAN = 5.672638 SIGMA = 0.426470
ROC5 NOISE			MEAN = 5.232945 SIGMA = 0.424747

Comment (if any): TestD showed 25 bad bumps in the middle of Chip 2

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:18 AM

Ibias_DAC, Ibias_DAC Data	150	134	142	134	134	128
Vana, VanaData	142	112	124	137	127	140
CalDelData and plots	84	96	89	84	89	87
VthrCompData and plots	81	66	67	73	71	80
TestDdata ,TestD Plots	0	0	25	0	0	0
LightData ,Light Plots	0	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD