P_2x3B_135_A

Production testing

Date:3/29/2007

Operator: Joseph Clampitt

start testing time:11:24 AM

Sensor: S_2x3B_13, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W36_XD4K3LT37D
ROC1W36_XD4K3LT37C
ROC2W36_XD4K3LT37B
ROC3W36_XD4K3LT54D
ROC4W36_XD4K3LT55A
ROC5W36_XD4K3LT55B

Depletion Voltage is -44 and suggested operational voltage is -84
Ibias_DAC, Ibias_DAC Data 128 138 140 138 148 136
Vana, VanaData 122 138 132 128 141 134
CalDelData and plots848497888992
VthrCompData and plots658569788481
TestDdata ,TestD Plots000000
LightData ,Light Plots100000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe13013595115110115
Vsf135140140130140140
VoffsetOp5095808010080
VIbias_PH1051009510010595
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.015818

SIGMA = 0.386832
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.781271

SIGMA = 0.381510
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.715849

SIGMA = 0.390885
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.389160

SIGMA = 0.321152
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.568078

SIGMA = 0.350005
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.841471

SIGMA = 0.393182

Comment (if any): Good

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:44 AM