P_2x3B_116_A

Production testing

Date:3/9/2007

Operator: Cameron McKinney

start testing time:9:39 AM

Sensor: S_2x3B_11, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W34_XA4K3PT29A
ROC1W34_XA4K3PT28D
ROC2W34_XA4K3PT28B
ROC3W34_XA4K3PT04D
ROC4W34_XA4K3PT05B
ROC5W34_XA4K3PT05D

Depletion Voltage is -48 and suggested operational voltage is -88
Ibias_DAC, Ibias_DAC Data 156 140 134 136 140 122
Vana, VanaData 128 127 131 132 133 141
CalDelData and plots789795939392
VthrCompData and plots857978737670
TestDdata ,TestD Plots000001
LightData ,Light Plots000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe11511513012512590
Vsf140140140140140140
VoffsetOp120105100957595
VIbias_PH100100100100105100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.359940

SIGMA = 0.333170
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.285941

SIGMA = 0.320770
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.378965

SIGMA = 0.337560
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.723935

SIGMA = 0.358606
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.882224

SIGMA = 0.383657
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 5.255065

SIGMA = 0.435821

Comment (if any): Good.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 9:59 AM