P_2x3B_073_A

Production testing

Date:5/29/2007

Operator: Emily Grace

start testing time:9:17 AM

Sensor: S_2x3B_07, Data for leakage current measurement , and plot on overall it is a BAD sensor
ROCROC waferLabel
ROC0W45_D3LQFLT53B
ROC1W45_D3LQFLT53A
ROC2W45_D3LQFLT47C
ROC3W45_D3LQFLT33A
ROC4W45_D3LQFLT33C
ROC5W45_D3LQFLT34A

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 140 148 146 150 154 148
Vana, VanaData 135 141 145 138 142 135
CalDelData and plots899596819393
VthrCompData and plots728986818685
TestDdata ,TestD Plots032000
LightData ,Light Plots020000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe8595951009595
Vsf145140145140140140
VoffsetOp908590100115110
VIbias_PH10010010510010595
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.370077

SIGMA = 0.330230
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.725666

SIGMA = 0.366602
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.676959

SIGMA = 0.358999
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.134792

SIGMA = 0.328854
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.017766

SIGMA = 0.340698
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.038320

SIGMA = 0.321713

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 9:43 AM