P_2x3B_067

P_2x3B_067_A

Production testing

Date:2/16/2007

Operator: Isaac Childres

start testing time:1:51 PM

Sensor: S_2x3B_06, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W29_X64K5ST 05C

ROC1 W29_X64K5ST 05B

ROC2 W29_X64K5ST 04D

ROC3 W33_XC4K5LT 67C

ROC4 W33_XC4K5LT 67D

ROC5 W33_XC4K5LT 68A

ROC	ROC wafer	Label
ROC0	W29_X64K5ST	05C
ROC1	W29_X64K5ST	05B
ROC2	W29_X64K5ST	04D
ROC3	W33_XC4K5LT	67C
ROC4	W33_XC4K5LT	67D
ROC5	W33_XC4K5LT	68A

Depletion Voltage is -72 and suggested operational voltage is -112

Ibias_DAC, Ibias_DAC Data 118 138 132 140 132 142

Vana, VanaData 135 134 122 148 135 137

CalDelData and plots 86 78 86 78 84 73

VthrCompData and plots 67 81 73 89 82 84

TestDdata ,TestD Plots 0 1 0 0 0 0

LightData ,Light Plots 0 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	95	115	130	90	125	100
Vsf	140	140	135	150	140	140
VoffsetOp	80	100	70	95	105	95
VIbias_PH	95	105	105	100	100	105

ROC0 NOISE			MEAN = 4.993958 SIGMA = 0.385259
ROC1 NOISE			MEAN = 4.794647 SIGMA = 0.375505
ROC2 NOISE			MEAN = 5.264108 SIGMA = 0.400062
ROC3 NOISE			MEAN = 5.136636 SIGMA = 0.397865
ROC4 NOISE			MEAN = 4.858833 SIGMA = 0.368085
ROC5 NOISE			MEAN = 4.636150 SIGMA = 0.375816

Comment (if any): Bad laser scan. Retesting.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 2:11 PM

Ibias_DAC, Ibias_DAC Data	118	138	132	140	132	142
Vana, VanaData	135	134	122	148	135	137
CalDelData and plots	86	78	86	78	84	73
VthrCompData and plots	67	81	73	89	82	84
TestDdata ,TestD Plots	0	1	0	0	0	0
LightData ,Light Plots	0	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD