P_2x3B_058_C

Production testing

Date:6/8/2007

Operator: Emily Grace

start testing time:11:38 AM

Sensor: S_2x3B_05, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0DULQEDT56B
ROC1DULQEDT56C
ROC2DULQEDT36D
ROC3DULQEDT66B
ROC4DULQEDT68C
ROC5DULQEDT66C

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 144 154 156 142 144 144
Vana, VanaData 151 150 141 129 150 138
CalDelData and plots979990928889
VthrCompData and plots908485748882
TestDdata ,TestD Plots021001
LightData ,Light Plots011001
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe9510010012095100
Vsf155150145140155140
VoffsetOp1001251007012085
VIbias_PH10010010010095100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.328954

SIGMA = 0.350041
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 3.914136

SIGMA = 0.332191
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.149488

SIGMA = 0.331949
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.527723

SIGMA = 0.368004
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.143121

SIGMA = 0.343995
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.397378

SIGMA = 0.355732

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:03 PM