P_2x3B_056_C

Production testing

Date:6/13/2007

Operator: Emily Grace

start testing time:1:00 PM

Sensor: S_2x3B_05, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0KZNG1JT38C
ROC1KZNG1JT48C
ROC2KZNG1JT48D
ROC3KZNG1JT38A
ROC4KZNG1JT49D
ROC5KZNG1JT76B

Depletion Voltage is -48 and suggested operational voltage is -88
Ibias_DAC, Ibias_DAC Data 158 150 142 150 156 144
Vana, VanaData 137 139 138 135 144 133
CalDelData and plots575957557170
VthrCompData and plots545655485353
TestDdata ,TestD Plots000020
LightData ,Light Plots000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe140951009095105
Vsf140145140140140140
VoffsetOp9010090859550
VIbias_PH1009510510010095
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.003060

SIGMA = 0.311295
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 3.956477

SIGMA = 0.328798
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.656612

SIGMA = 0.380073
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.526858

SIGMA = 0.363353
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.204990

SIGMA = 0.359443
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.462121

SIGMA = 0.397156

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 1:22 PM