P_2x3B_030

P_2x3B_030_A

Production testing

Date:4/26/2007

Operator: Joseph Clampitt

start testing time:12:10 PM

Sensor: S_2x3B_03, Data for leakage current measurement , and plot on overall it is a BAD sensor

ROC ROC wafer Label

ROC0 W35_XH4K3HT 14B

ROC1 W35_XH4K3HT 14A

ROC2 W35_XH4K3HT 13D

ROC3 W35_XH4K3HT 32C

ROC4 W35_XH4K3HT 33B

ROC5 W35_XH4K3HT 33C

ROC	ROC wafer	Label
ROC0	W35_XH4K3HT	14B
ROC1	W35_XH4K3HT	14A
ROC2	W35_XH4K3HT	13D
ROC3	W35_XH4K3HT	32C
ROC4	W35_XH4K3HT	33B
ROC5	W35_XH4K3HT	33C

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 134 134 140 154 130 128

Vana, VanaData 124 117 132 140 138 127

CalDelData and plots 89 94 80 64 80 90

VthrCompData and plots 65 78 81 83 71 75

TestDdata ,TestD Plots 1 1 0 1 2 0

LightData ,Light Plots 0 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	125	145	115	105	95	115
Vsf	140	130	140	140	140	140
VoffsetOp	80	80	80	125	70	60
VIbias_PH	95	95	100	100	100	100

ROC0 NOISE			MEAN = 4.774502 SIGMA = 0.390662
ROC1 NOISE			MEAN = 4.907636 SIGMA = 0.415210
ROC2 NOISE			MEAN = 5.175498 SIGMA = 0.407668
ROC3 NOISE			MEAN = 3.637713 SIGMA = 0.275675
ROC4 NOISE			MEAN = 5.206091 SIGMA = 0.384105
ROC5 NOISE			MEAN = 4.910788 SIGMA = 0.401395

Comment (if any): Sensor is BAD.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:29 PM

Ibias_DAC, Ibias_DAC Data	134	134	140	154	130	128
Vana, VanaData	124	117	132	140	138	127
CalDelData and plots	89	94	80	64	80	90
VthrCompData and plots	65	78	81	83	71	75
TestDdata ,TestD Plots	1	1	0	1	2	0
LightData ,Light Plots	0	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD