P_2x3B_028

P_2x3B_028_C

Production testing

Date:2/12/2007

Operator: Isaac Childres

start testing time:11:12 AM

Sensor: S_2x3B_02, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XE4K3KT 43B

ROC1 XE4K3KT 43A

ROC2 XE4K3KT 42B

ROC3 XE4K3KT 44A

ROC4 XE4K3KT 44B

ROC5 XE4K3KT 45A

ROC	ROC wafer	Label
ROC0	XE4K3KT	43B
ROC1	XE4K3KT	43A
ROC2	XE4K3KT	42B
ROC3	XE4K3KT	44A
ROC4	XE4K3KT	44B
ROC5	XE4K3KT	45A

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 138 128 150 140 130 138

Vana, VanaData 142 126 135 132 127 138

CalDelData and plots 101 91 94 96 85 78

VthrCompData and plots 76 61 75 72 72 89

TestDdata ,TestD Plots 0 0 0 1 0 1

LightData ,Light Plots 0 0 2 0 1 4

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

ROC0 NOISE			MEAN = 4.702798 SIGMA = 0.379795
ROC1 NOISE			MEAN = 4.424059 SIGMA = 0.360418
ROC2 NOISE			MEAN = 4.193963 SIGMA = 0.334370
ROC3 NOISE			MEAN = 4.724264 SIGMA = 0.383760
ROC4 NOISE			MEAN = 4.188389 SIGMA = 0.339146
ROC5 NOISE			MEAN = 5.452302 SIGMA = 0.434234

Comment (if any): Okay.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:29 AM

Ibias_DAC, Ibias_DAC Data	138	128	150	140	130	138
Vana, VanaData	142	126	135	132	127	138
CalDelData and plots	101	91	94	96	85	78
VthrCompData and plots	76	61	75	72	72	89
TestDdata ,TestD Plots	0	0	0	1	0	1
LightData ,Light Plots	0	0	2	0	1	4
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD