P_2x3B_025_C-6

Production testing

Date:1/29/2007

Operator: Joseph Clampitt

start testing time:11:35 AM

Sensor: S_2x3B_02, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4KFET03B
ROC1XE4KFET14B
ROC2XE4KFET11D
ROC3XE4KFET13C
ROC4XE4KFET13D
ROC5XE4KFET15B

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 142 148 142 144 126 134
Vana, VanaData 113 132 134 146 140 127
TestDdata ,TestD Plots000002
LightData ,Light Plots000004
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): GOOD

This Device have been tested 6Times prior to this one and here are the links to the previous tests:

P_2x3B_025_C-1.html,

P_2x3B_025_C-2.html,

P_2x3B_025_C-3.html,

P_2x3B_025_C-4.html,

P_2x3B_025_C-5.html,

P_2x3B_025_C.html,

End testing time: 11:41 AM