P_2x3B_014

P_2x3B_014_C

Production testing

Date:2/9/2007

Operator: Isaac Childres

start testing time:1:29 PM

Sensor: S_2x3B_01, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XE4K3KT 28D

ROC1 XE4K3KT 29D

ROC2 XE4K3KT 20B

ROC3 XE4K3KT 22A

ROC4 XE4K3KT 21B

ROC5 XE4K3KT 21A

ROC	ROC wafer	Label
ROC0	XE4K3KT	28D
ROC1	XE4K3KT	29D
ROC2	XE4K3KT	20B
ROC3	XE4K3KT	22A
ROC4	XE4K3KT	21B
ROC5	XE4K3KT	21A

Depletion Voltage is -48 and suggested operational voltage is -88

Ibias_DAC, Ibias_DAC Data 142 138 130 132 132 128

Vana, VanaData 133 144 107 137 131 128

CalDelData and plots 78 93 85 80 80 94

VthrCompData and plots 78 74 75 73 78 70

TestDdata ,TestD Plots 0 2 2 1 0 0

LightData ,Light Plots 0 0 2 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

ROC0 NOISE			MEAN = 4.799549 SIGMA = 0.371821
ROC1 NOISE			MEAN = 5.490436 SIGMA = 0.433999
ROC2 NOISE			MEAN = 4.091339 SIGMA = 0.296101
ROC3 NOISE			MEAN = 4.925148 SIGMA = 0.415875
ROC4 NOISE			MEAN = 5.593541 SIGMA = 0.418824
ROC5 NOISE			MEAN = 4.535182 SIGMA = 0.355965

Comment (if any): Okay.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 1:46 PM

Ibias_DAC, Ibias_DAC Data	142	138	130	132	132	128
Vana, VanaData	133	144	107	137	131	128
CalDelData and plots	78	93	85	80	80	94
VthrCompData and plots	78	74	75	73	78	70
TestDdata ,TestD Plots	0	2	2	1	0	0
LightData ,Light Plots	0	0	2	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD