P_2x3B_004_C

Production testing

Date:2/7/2007

Operator: Gino Bolla

start testing time:4:18 PM

Sensor: S_2x3B_00, Data for leakage current measurement , and plot on overall it is a
ROCROC waferLabel
ROC0XE4K3KT05A
ROC1XE4K3KT04B
ROC2XE4K3KT04A
ROC3XE4K3KT05D
ROC4XE4K3KT03A
ROC5XE4K3KT03B

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 128 138 138 130 126 130
Vana, VanaData 142 128 126 139 138 131
CalDelData and plots918881838490
VthrCompData and plots778087738383
TestDdata ,TestD Plots300000
LightData ,Light Plots000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.814246

SIGMA = 0.363977
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 5.509327

SIGMA = 0.415102
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.293478

SIGMA = 0.415149
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 5.314345

SIGMA = 0.434157
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 6.133102

SIGMA = 0.477901
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.936693

SIGMA = 0.368616

Comment (if any): TO SPARES

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 4:34 PM