P_1x5R_172

P_1x5R_172_C

Production testing

Date:4/6/2007

Operator: Cameron McKinney

start testing time:11:07 AM

Sensor: S_1x5R_17, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XH4KFBT 53C

ROC1 XH4KFBT 55D

ROC2 XH4KFBT 56C

ROC3 XH4KFBT 54D

ROC4 XH4KFBT 53D

ROC	ROC wafer	Label
ROC0	XH4KFBT	53C
ROC1	XH4KFBT	55D
ROC2	XH4KFBT	56C
ROC3	XH4KFBT	54D
ROC4	XH4KFBT	53D

Depletion Voltage is -48 and suggested operational voltage is -88

Ibias_DAC, Ibias_DAC Data 138 138 144 140 144

Vana, VanaData 124 126 140 127 141

CalDelData and plots 89 67 68 89 76

VthrCompData and plots 74 69 80 65 79

TestDdata ,TestD Plots 0 10 1 0 0

LightData ,Light Plots 10 28 1 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	135	140	90	110	120
Vsf	140	135	140	135	145
VoffsetOp	70	65	100	50	80
VIbias_PH	100	100	100	100	100

ROC0 NOISE			MEAN = 4.757440 SIGMA = 0.404721
ROC1 NOISE			MEAN = 5.195013 SIGMA = 0.427753
ROC2 NOISE			MEAN = 4.631685 SIGMA = 0.369509
ROC3 NOISE			MEAN = 5.485057 SIGMA = 0.435092
ROC4 NOISE			MEAN = 4.923147 SIGMA = 0.367710

Comment (if any): Light test shows 28 bad bumps on ROC1, otherwise good.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:26 AM

Ibias_DAC, Ibias_DAC Data	138	138	144	140	144
Vana, VanaData	124	126	140	127	141
CalDelData and plots	89	67	68	89	76
VthrCompData and plots	74	69	80	65	79
TestDdata ,TestD Plots	0	10	1	0	0
LightData ,Light Plots	10	28	1	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD