P_1x5R_167_C

Production testing

Date:5/1/2007

Operator: mia tosi

start testing time:10:19 AM

Sensor: S_1x5R_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0KNNG0DT18D
ROC1KNNG0DT18A
ROC2KNNG0DT28B
ROC3KNNG0DT38D
ROC4KNNG0DT38C

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 128 146 130 132 144
Vana, VanaData 129 141 135 129 133
CalDelData and plots7579827783
VthrCompData and plots6875756675
TestDdata ,TestD Plots00040
LightData ,Light Plots00000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe10595110115100
Vsf140140140140140
VoffsetOp7095859090
VIbias_PH95100100105100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.197868

SIGMA = 0.426552
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.611321

SIGMA = 0.368845
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.999591

SIGMA = 0.386500
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 5.026627

SIGMA = 0.398775
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.431279

SIGMA = 0.347620

Comment (if any): good

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 10:38 AM