Sensor: S_1x5R_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor
| ROC | ROC wafer | Label |
|---|---|---|
| ROC0 | W53_DXLQG9T | 58D |
| ROC1 | W53_DXLQG9T | 58C |
| ROC2 | W53_DXLQG9T | 58B |
| ROC3 | W53_DXLQG9T | 58A |
| ROC4 | W53_DXLQG9T | 57D |
Inspected by Lockwood Gale on date 12/11/2007
| LR_dev | 0.010 |
| LL_dev | 0.012 |
PLAQUETTE GLUED with HALF PRESSURE
| FINAL COMMENT by Lockwood Gale | Force used to join BBM to VHDI = 2 kg per ROC. No assembly problems. ROC0 ch5,6 wo 2 tries each. No other wirebonding problems. |
PLAQUETTE made READY for ENCAPSULATION on 12/11/2007 by Lockwood Gale
PLAQUETTE encapsulated on 12/12/2007 by Ozhan Koybasi
PLAQUETTE made READY for testing on 12/12/2007 by Ozhan Koybasi
P_1x5R_164_Aon 12/13/2007 10:08 AM
P_1x5R_164_Aon 12/13/2007 10:08 AM
PLAQUETTE TESTED on 2007-12-13 by Gino Bolla
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| ROC | ROC0 | ROC1 | ROC2 | ROC3 | ROC4 | |
| Ibias_DAC | 156 | 154 | 146 | 162 | 166 | |
| Vana | 139 | 139 | 150 | 163 | 146 | |
| Cal_Del | 77 | 86 | 84 | 69 | 77 | |
| Vthrs_Comp | 89 | 82 | 83 | 93 | 92 | |
| Unbumped | 37 | 1 | 0 | 0 | 0 | |
| Dead | 0 | 2 | 3 | 0 | 0 | |
| Noisy | 0 | 0 | 0 | 0 | 0 | |
| Undecoded | 0 | 0 | 0 | 0 | 0 | |
| Total BAD | 37 | 3 | 3 | 0 | 0 |
| ASSEMBLY_XML-File | SUMMARY_XML-File, and SUMMARY_PER_ROC_XML-File |
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I_BIAS_DAC_XML-File |
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VANA_XML-File |
| DEAD_XML-File | |
| NOISY_XML-File | |
| UNDECODED_XML-File | |
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LIGHT_XML-File |
EXTRA DACs for NOISE
| VHldDe | 105 | 105 | 90 | 100 | 95 |
| Vsf | 140 | 140 | 150 | 160 | 145 |
| VoffsetOp | 95 | 105 | 125 | 130 | 120 |
| VIbias_PH | 105 | 105 | 100 | 100 | 100 |
| Ibias_DAC, Ibias_DAC Data | 156 | 154 | 146 | 162 | 166 |
| Vana, VanaData | 139 | 139 | 150 | 163 | 146 | FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
| TestDdata ,TestD Plots | 0 | 0 | 0 | 0 | 0 |
| LightData ,Light Plots | 10 | 0 | 0 | 0 | 0 |
| Pass/Fail TestD | GOOD | GOOD | GOOD | GOOD | GOOD |
| Pass/Fail LIGHT | GOOD | GOOD | GOOD | GOOD | GOOD |
Comment (if any):
This Device have been tested 1Times prior to this one and here are the links to the previous tests:End testing time: 10:43 AM