P_1x5R_160_C

Production testing

Date:6/20/2007

Operator: Emily Grace

start testing time:2:52 PM

Sensor: S_1x5R_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0KBNG0QT15A
ROC1KBNG0QT13C
ROC2KBNG0QT75B
ROC3KBNG0QT75A
ROC4KBNG0QT35A

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 142 154 150 154 166
Vana, VanaData 128 146 124 135 144
CalDelData and plots6466929865
VthrCompData and plots9184807590
TestDdata ,TestD Plots00000
LightData ,Light Plots2366111
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe1209515512090
Vsf140145135145145
VoffsetOp80957595105
VIbias_PH10595105100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.694996

SIGMA = 0.356863
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 3.896336

SIGMA = 0.295463
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.851413

SIGMA = 0.403727
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 3.967857

SIGMA = 0.328519
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 3.834418

SIGMA = 0.311851

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 3:18 PM