P_1x5R_135_A

Production testing

Date:4/17/2007

Operator: Gino Bolla

start testing time:1:33 PM

Sensor: S_1x5R_13, Data for leakage current measurement , and plot on overall it is a
ROCROC waferLabel
ROC0W36_XD4K3LT37A
ROC1W36_XD4K3LT36C
ROC2W36_XD4K3LT36B
ROC3W36_XD4K3LT36A
ROC4W36_XD4K3LT35D

Depletion Voltage is -96 and suggested operational voltage is -136
Ibias_DAC, Ibias_DAC Data 146 138 126 130 290
Vana, VanaData 149 125 131 127 127
CalDelData and plots85788000
VthrCompData and plots85767400
TestDdata ,TestD Plots27372970285000
LightData ,Light Plots00000
Pass/Fail TestD BAD BAD BAD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe8512012500
Vsf14513513500
VoffsetOp120908000
VIbias_PH1001009500
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.915362

SIGMA = 0.593012
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 6.042903

SIGMA = 0.590517
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 7.695931

SIGMA = 0.666419
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = NaN

SIGMA = NaN
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = NaN

SIGMA = NaN

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 2:11 PM