P_1x5R_134

P_1x5R_134_A

Production testing

Date:4/30/2007

Operator: mia tosi

start testing time:12:49 PM

Sensor: S_1x5R_13, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W35_XH4K3HT 23A

ROC1 W35_XH4K3HT 22D

ROC2 W35_XH4K3HT 22C

ROC3 W35_XH4K3HT 22B

ROC4 W35_XH4K3HT 21D

ROC	ROC wafer	Label
ROC0	W35_XH4K3HT	23A
ROC1	W35_XH4K3HT	22D
ROC2	W35_XH4K3HT	22C
ROC3	W35_XH4K3HT	22B
ROC4	W35_XH4K3HT	21D

Depletion Voltage is -50 and suggested operational voltage is -90

Ibias_DAC, Ibias_DAC Data 124 132 146 144 138

Vana, VanaData 120 126 149 125 127

CalDelData and plots 85 70 64 89 99

VthrCompData and plots 75 71 85 66 75

TestDdata ,TestD Plots 0 0 0 5 0

LightData ,Light Plots 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	125	125	95	115	135
Vsf	135	140	145	140	140
VoffsetOp	65	60	105	60	95
VIbias_PH	95	105	100	105	105

ROC0 NOISE			MEAN = 4.841781 SIGMA = 0.396367
ROC1 NOISE			MEAN = 5.874768 SIGMA = 0.472916
ROC2 NOISE			MEAN = 4.302000 SIGMA = 0.351200
ROC3 NOISE			MEAN = 5.496759 SIGMA = 0.430194
ROC4 NOISE			MEAN = 5.026832 SIGMA = 0.402383

Comment (if any): good

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 1:10 PM

Ibias_DAC, Ibias_DAC Data	124	132	146	144	138
Vana, VanaData	120	126	149	125	127
CalDelData and plots	85	70	64	89	99
VthrCompData and plots	75	71	85	66	75
TestDdata ,TestD Plots	0	0	0	5	0
LightData ,Light Plots	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD