P_1x5R_105_C

Production testing

Date:4/11/2007

Operator: Cameron McKinney

start testing time:11:21 AM

Sensor: S_1x5R_10, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XW4KFXT49A
ROC1XW4KFXT74A
ROC2XW4KFXT75B
ROC3XW4KFXT76A
ROC4XW4KFXT29C

Depletion Voltage is -60 and suggested operational voltage is -100
Ibias_DAC, Ibias_DAC Data 130 144 138 118 130
Vana, VanaData 135 128 142 126 133
CalDelData and plots60678310379
VthrCompData and plots9086796867
TestDdata ,TestD Plots10001
LightData ,Light Plots00005
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe125135100130105
Vsf140135140140140
VoffsetOp100751006595
VIbias_PH105105105100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.259406

SIGMA = 0.408529
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.814230

SIGMA = 0.367000
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.091428

SIGMA = 0.395103
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 5.258097

SIGMA = 0.435980
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.745725

SIGMA = 0.374921

Comment (if any): Good.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:39 AM