P_1x5R_058

P_1x5R_058_C

Production testing

Date:6/29/2007

Operator: Emily Grace

start testing time:11:05 AM

Sensor: S_1x5R_05, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 KZNG1JT 22C

ROC1 KZNG1JT 32A

ROC2 KZNG1JT 32C

ROC3 KZNG1JT 22D

ROC4 KZNG1JT 32D

ROC	ROC wafer	Label
ROC0	KZNG1JT	22C
ROC1	KZNG1JT	32A
ROC2	KZNG1JT	32C
ROC3	KZNG1JT	22D
ROC4	KZNG1JT	32D

Depletion Voltage is -48 and suggested operational voltage is -88

Ibias_DAC, Ibias_DAC Data 154 170 170 154 148

Vana, VanaData 130 147 154 134 129

CalDelData and plots 80 69 78 67 84

VthrCompData and plots 78 90 85 90 79

TestDdata ,TestD Plots 0 0 0 0 20

LightData ,Light Plots 0 0 0 0 16

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	135	110	95	110	125
Vsf	140	145	155	140	140
VoffsetOp	75	105	100	85	80
VIbias_PH	100	100	100	95	100

ROC0 NOISE			MEAN = 4.369414 SIGMA = 0.338846
ROC1 NOISE			MEAN = 3.513003 SIGMA = 0.276439
ROC2 NOISE			MEAN = 3.737246 SIGMA = 0.292649
ROC3 NOISE			MEAN = 4.318459 SIGMA = 0.359414
ROC4 NOISE			MEAN = 4.622187 SIGMA = 0.380941

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:31 AM

Ibias_DAC, Ibias_DAC Data	154	170	170	154	148
Vana, VanaData	130	147	154	134	129
CalDelData and plots	80	69	78	67	84
VthrCompData and plots	78	90	85	90	79
TestDdata ,TestD Plots	0	0	0	0	20
LightData ,Light Plots	0	0	0	0	16
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD