P_1x5R_056_C

Production testing

Date:6/26/2007

Operator: Emily Grace

start testing time:11:03 AM

Sensor: S_1x5R_05, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0KZNG1JT76C
ROC1KZNG1JT18B
ROC2KZNG1JT28A
ROC3KZNG1JT28B
ROC4KZNG1JT56B

Depletion Voltage is -48 and suggested operational voltage is -88
Ibias_DAC, Ibias_DAC Data 160 156 146 144 158
Vana, VanaData 144 130 122 126 147
CalDelData and plots8081739366
VthrCompData and plots7678796483
TestDdata ,TestD Plots05001
LightData ,Light Plots115103
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe10512012512095
Vsf140140140140145
VoffsetOp7595708080
VIbias_PH1051001009595
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.289746

SIGMA = 0.354895
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 3.939418

SIGMA = 0.297737
ROC2 NOISEÔo#øšR:qIr-ÅÉøz7bú–vüLð…¼8¯µ®õ�ô�X‹Ò—­&Ç„* Î!cUÊ5xÒ9ÉxžfÆß Y�u-^ðÓáð^þÇý¼ó|?Ô0z`ñ=`z™3�Ô]×kRqœ:ÂðY¹øÊ-³¡ÜKY¤Â0.l�_„c©“Ç+ŒàéÉÞh:wóGÿ4!´¨EÄb­k}Í[!ù-„f·^ϱþùqüròçkè·ur—Uçf"¡à|ѶòXe9Ò|h¬¶Õ æIN<�ñ›Z #”=³õwîæV+ë™ý"×±ú6pÉM«àN4§·˜›e*Æ�ÕžaÑÜÁigþÏ Ç(‹bP¤³}¶@]¯ vjö©8—þ6¡S¬4â¨ùÅ/[&å;n¶3ëÁÒÏÜJAõs{êåßTWó\ݦ¶ë&uzÇßuà4'kç>f/‹SYŠa~{G9 É1×ÊêLùâÁn ð�ì²��·Ã/på2ØŸGvk°»<V,ȳÄÆXÉ0”1'•ÛAwÓˆºë?R«.núóÄ�¹,0²{ºq(Êö¯åE5h�1+ÄZæ&$Kß_¼ÃŸP–*ø`,`�ò<Å%TCÿ{ †fΚ†ÔfÚ>u¥È”ÁáÓˆ¾âò N‰¯Ð 1ù&à~F謿aƒe“ _† DŒNx\b¯�±ã`º�—Æ^J”…Ð?£«† )qpëêŽß裇�å…½nhSjÀ«º]A�SX…Fú¸—fò<˜ˆåDÌÓo ÍL¢¯cP¼seé‚vj \:<épãoÄT@áå›{ �.éV+ ‡Z'ˆ(�DÙhB?¥«l릛Í;u˜/²\ÏμC§­Ôªž3½i-wkì�ájˆ—Ók{