P_1x5R_049_A

Production testing

Date:6/21/2007

Operator: Emily Grace

start testing time:1:26 PM

Sensor: S_1x5R_04, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W48_DVLQDVT57A
ROC1W48_DVLQDVT56D
ROC2W48_DVLQDVT56B
ROC3W48_DVLQDVT55C
ROC4W48_DVLQDVT55B

Depletion Voltage is -44 and suggested operational voltage is -84
Ibias_DAC, Ibias_DAC Data 148 176 156 158 146
Vana, VanaData 160 154 145 144 146
CalDelData and plots8694848986
VthrCompData and plots9286869289
TestDdata ,TestD Plots188283469
LightData ,Light Plots02001
Pass/Fail TestD GOOD BAD BAD BAD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe909590100100
Vsf160150145145145
VoffsetOp10513011095105
VIbias_PH10095100105100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.047577

SIGMA = 0.310827
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = -21310.553417

SIGMA = 305958.660722
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 20437.609299

SIGMA = 223189.857668
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.255114

SIGMA = 0.337837
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.250555

SIGMA = 0.356755

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 1:52 PM