P_1x5R_048

P_1x5R_048_C

Production testing

Date:2/28/2007

Operator: Isaac Childres

start testing time:11:16 AM

Sensor: S_1x5R_04, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XG4KFCT 28B

ROC1 XG4KFCT 27B

ROC2 XG4KFCT 27A

ROC3 XG4KFCT 26B

ROC4 XG4KFCT 26A

ROC	ROC wafer	Label
ROC0	XG4KFCT	28B
ROC1	XG4KFCT	27B
ROC2	XG4KFCT	27A
ROC3	XG4KFCT	26B
ROC4	XG4KFCT	26A

Depletion Voltage is -44 and suggested operational voltage is -84

Ibias_DAC, Ibias_DAC Data 128 142 144 138 128

Vana, VanaData 127 130 144 135 133

CalDelData and plots 99 82 83 85 94

VthrCompData and plots 75 69 80 75 75

TestDdata ,TestD Plots 2 24 0 0 2

LightData ,Light Plots 3 0 0 0 2

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	135	120	105	135	120
Vsf	140	140	145	145	140
VoffsetOp	75	65	95	90	80
VIbias_PH	95	105	100	105	95

ROC0 NOISE			MEAN = 5.064071 SIGMA = 0.429037
ROC1 NOISE			MEAN = 5.459848 SIGMA = 0.444548
ROC2 NOISE			MEAN = 4.415499 SIGMA = 0.350132
ROC3 NOISE			MEAN = 5.120707 SIGMA = 0.388273
ROC4 NOISE			MEAN = 5.159768 SIGMA = 0.388632

Comment (if any): Okay.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:35 AM

Ibias_DAC, Ibias_DAC Data	128	142	144	138	128
Vana, VanaData	127	130	144	135	133
CalDelData and plots	99	82	83	85	94
VthrCompData and plots	75	69	80	75	75
TestDdata ,TestD Plots	2	24	0	0	2
LightData ,Light Plots	3	0	0	0	2
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD