P_1x5R_046

P_1x5R_046_A-1

Production testing

Date:6/7/2007

Operator: Emily Grace

start testing time:12:35 PM

Sensor: S_1x5R_04, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W36_XD4K3LT 06A

ROC1 W36_XD4K3LT 05D

ROC2 W36_XD4K3LT 04C

ROC3 W36_XD4K3LT 04B

ROC4 W36_XD4K3LT 04A

ROC	ROC wafer	Label
ROC0	W36_XD4K3LT	06A
ROC1	W36_XD4K3LT	05D
ROC2	W36_XD4K3LT	04C
ROC3	W36_XD4K3LT	04B
ROC4	W36_XD4K3LT	04A

Depletion Voltage is -50 and suggested operational voltage is -90

Ibias_DAC, Ibias_DAC Data 146 164 144 160 162

Vana, VanaData 125 142 117 129 140

CalDelData and plots 97 89 93 83 89

VthrCompData and plots 69 75 75 81 81

TestDdata ,TestD Plots 13 6 0 0 1

LightData ,Light Plots 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	135	90	140	125	95
Vsf	140	140	140	140	145
VoffsetOp	60	80	65	100	90
VIbias_PH	100	100	95	100	100

ROC0 NOISE			MEAN = 4.912453 SIGMA = 0.417799
ROC1 NOISE			MEAN = 4.601524 SIGMA = 0.357402
ROC2 NOISE			MEAN = 4.644451 SIGMA = 0.392623
ROC3 NOISE			MEAN = 4.252893 SIGMA = 0.327828
ROC4 NOISE			MEAN = 4.454295 SIGMA = 0.543875

Comment (if any):

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_1x5R_046_A.html,

End testing time: 1:12 PM

Ibias_DAC, Ibias_DAC Data	146	164	144	160	162
Vana, VanaData	125	142	117	129	140
CalDelData and plots	97	89	93	83	89
VthrCompData and plots	69	75	75	81	81
TestDdata ,TestD Plots	13	6	0	0	1
LightData ,Light Plots	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD