P_1x5R_035

P_1x5R_035_A

Production testing

Date:11/15/2007

Operator: Ozhan Koybasi

start testing time:9:49 PM

Sensor: S_1x5R_03, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W55_D3LQE4T 40A

ROC1 W55_D3LQE4T 58D

ROC2 W55_D3LQE4T 58B

ROC3 W55_D3LQE4T 57D

ROC4 W55_D3LQE4T 57B

ROC	ROC wafer	Label
ROC0	W55_D3LQE4T	40A
ROC1	W55_D3LQE4T	58D
ROC2	W55_D3LQE4T	58B
ROC3	W55_D3LQE4T	57D
ROC4	W55_D3LQE4T	57B

Depletion Voltage is -48 and suggested operational voltage is -88

Ibias_DAC, Ibias_DAC Data 176 166 146 172 154

Vana, VanaData 156 160 148 143 148

CalDelData and plots 84 86 74 95 87

VthrCompData and plots 91 94 89 88 92

TestDdata ,TestD Plots 1 0 1 2 0

LightData ,Light Plots 0 0 1 0 1

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	105	105	105	100	95
Vsf	155	160	145	140	145
VoffsetOp	120	110	110	115	115
VIbias_PH	105	105	100	100	95

ROC0 NOISE			MEAN = 3.891688 SIGMA = 0.305776
ROC1 NOISE			MEAN = 4.241028 SIGMA = 0.330948
ROC2 NOISE			MEAN = 4.312146 SIGMA = 0.336293
ROC3 NOISE			MEAN = 3.665939 SIGMA = 0.276007
ROC4 NOISE			MEAN = 4.040505 SIGMA = 0.318926

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 10:18 PM

Ibias_DAC, Ibias_DAC Data	176	166	146	172	154
Vana, VanaData	156	160	148	143	148
CalDelData and plots	84	86	74	95	87
VthrCompData and plots	91	94	89	88	92
TestDdata ,TestD Plots	1	0	1	2	0
LightData ,Light Plots	0	0	1	0	1
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD