P_1x5R_034_A

Production testing

Date:5/22/2007

Operator: Emily Grace

start testing time:10:34 AM

Sensor: S_1x5R_03, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W35_XH4K3HT04C
ROC1W35_XH4K3HT04B
ROC2W35_XH4K3HT04A
ROC3W35_XH4K3HT03D
ROC4W35_XH4K3HT03C

Depletion Voltage is -50 and suggested operational voltage is -90
Ibias_DAC, Ibias_DAC Data 140 146 140 154 160
Vana, VanaData 123 137 127 131 127
CalDelData and plots9686878988
VthrCompData and plots6681687577
TestDdata ,TestD Plots00102
LightData ,Light Plots00001
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe130110130110130
Vsf130140135140135
VoffsetOp4585707565
VIbias_PH105100105100105
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.266795

SIGMA = 0.422535
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.295232

SIGMA = 0.316339
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.946716

SIGMA = 0.396123
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.642451

SIGMA = 0.360509
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.525808

SIGMA = 0.365931

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 10:57 AM