P_1x5R_028

P_1x5R_028_C

Production testing

Date:2/12/2007

Operator: Isaac Childres

start testing time:12:55 PM

Sensor: S_1x5R_02, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XE4K3KT 30D

ROC1 XE4K3KT 26B

ROC2 XE4K3KT 27A

ROC3 XE4K3KT 28A

ROC4 XE4K3KT 29A

ROC	ROC wafer	Label
ROC0	XE4K3KT	30D
ROC1	XE4K3KT	26B
ROC2	XE4K3KT	27A
ROC3	XE4K3KT	28A
ROC4	XE4K3KT	29A

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 126 140 150 134 132

Vana, VanaData 124 134 139 122 122

CalDelData and plots 82 83 70 91 87

VthrCompData and plots 79 84 88 64 79

TestDdata ,TestD Plots 0 0 0 0 4

LightData ,Light Plots 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

ROC0 NOISE			MEAN = 4.299959 SIGMA = 0.340810
ROC1 NOISE			MEAN = 5.150453 SIGMA = 0.428277
ROC2 NOISE			MEAN = 5.351635 SIGMA = 0.417564
ROC3 NOISE			MEAN = 4.416182 SIGMA = 0.343819
ROC4 NOISE			MEAN = 5.060168 SIGMA = 0.401572

Comment (if any): Okay. 4 dead on ROC4 in a clump.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 1:11 PM

Ibias_DAC, Ibias_DAC Data	126	140	150	134	132
Vana, VanaData	124	134	139	122	122
CalDelData and plots	82	83	70	91	87
VthrCompData and plots	79	84	88	64	79
TestDdata ,TestD Plots	0	0	0	0	4
LightData ,Light Plots	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD