Sensor: S_1x5R_02, Data for leakage current measurement , and plot on overall it is a
| ROC | ROC wafer | Label |
|---|---|---|
| ROC0 | DWLQFTT | 16C |
| ROC1 | DWLQFTT | 17D |
| ROC2 | DWLQFTT | 13B |
| ROC3 | DWLQFTT | 15C |
| ROC4 | DWLQFTT | 15A |
| Ibias_DAC, Ibias_DAC Data | 102 | 130 | 108 | 106 | 112 |
| Vana, VanaData | 174 | 181 | 179 | 191 | 195 |
| CalDelData and plots | 70 | 70 | 70 | 70 | 70 |
| VthrCompData and plots | 70 | 69 | 70 | 70 | 70 | Depletion Voltage is -88 and suggested operational voltage is -128
| TestDdata ,TestD Plots | 4185 | 4183 | 4184 | 4182 | 4185 |
| LightData ,Light Plots | 142 | 367 | 588 | 27 | 289 |
| Pass/Fail TestD | BAD | BAD | BAD | BAD | BAD |
| Pass/Fail LIGHT | BAD | BAD | BAD | GOOD | BAD |
Noise MAP
![[IMAGE] of](P_1x5R_024_C-200-noise.jpg)
Efficiency MAP
![[IMAGE] of](P_1x5R_024_C-200-efficiency.jpg)
EXTRA DACs for NOISE
| VHldDe | 215 | 135 | 0 | 60 | 180 |
| Vsf | 90 | 215 | 120 | 235 | 185 |
| VoffsetOp | 240 | 240 | 240 | 0 | 240 |
| VIbias_PH | 240 | 0 | 0 | 0 | 0 |
| ROC0 NOISE | ![[IMAGE] of](P_1x5R_024_C-200-noise-ROC0-MAP.jpg) | ![[IMAGE] of](P_1x5R_024_C-200-noise-ROC0-HISTO.jpg) | MEAN = 21.061845SIGMA = 3.962255 |
| ROC1 NOISE | ![[IMAGE] of](P_1x5R_024_C-200-noise-ROC1-MAP.jpg) | ![[IMAGE] of](P_1x5R_024_C-200-noise-ROC1-HISTO.jpg) | MEAN = 2.748466SIGMA = 0.516099 |
| ROC2 NOISE | ![[IMAGE] of](P_1x5R_024_C-200-noise-ROC2-MAP.jpg) | ![[IMAGE] of](P_1x5R_024_C-200-noise-ROC2-HISTO.jpg) | MEAN = 2.683312SIGMA = 0.464566 |
| ROC3 NOISE | ![[IMAGE] of](P_1x5R_024_C-200-noise-ROC3-MAP.jpg) | ![[IMAGE] of](P_1x5R_024_C-200-noise-ROC3-HISTO.jpg) | MEAN = 2.620295SIGMA = 0.571439 |
| ROC4 NOISE | ![[IMAGE] of](P_1x5R_024_C-200-noise-ROC4-MAP.jpg) | ![[IMAGE] of](P_1x5R_024_C-200-noise-ROC4-HISTO.jpg) | MEAN = 2.623029SIGMA = 0.459732 |
Comment (if any): SO BAD
This Device have been tested 0Times prior to this one and here are the links to the previous tests:End testing time: 2:28 PM