Sensor: S_1x5R_01, Data for leakage current measurement , and plot on overall it is a GOOD sensor
| ROC | ROC wafer | Label |
|---|---|---|
| ROC0 | XE4K3KT | 35D |
| ROC1 | XE4K3KT | 36D |
| ROC2 | XE4K3KT | 38C |
| ROC3 | XE4K3KT | 34C |
| ROC4 | XE4K3KT | 26A |
| Ibias_DAC, Ibias_DAC Data | 124 | 128 | 128 | 132 | 132 |
| Vana, VanaData | 124 | 127 | 116 | 125 | 141 |
| CalDelData and plots | 93 | 82 | 97 | 84 | 79 |
| VthrCompData and plots | 63 | 73 | 58 | 74 | 81 | Depletion Voltage is -46 and suggested operational voltage is -86
| TestDdata ,TestD Plots | 0 | 3 | 2 | 0 | 0 |
| LightData ,Light Plots | 1 | 0 | 0 | 0 | 0 |
| Pass/Fail TestD | GOOD | GOOD | GOOD | GOOD | GOOD |
| Pass/Fail LIGHT | GOOD | GOOD | GOOD | GOOD | GOOD |
Noise MAP
![[IMAGE] of](P_1x5R_014_C-100-noise.jpg)
Efficiency MAP
![[IMAGE] of](P_1x5R_014_C-100-efficiency.jpg)
| ROC0 NOISE | ![[IMAGE] of](P_1x5R_014_C-100-noise-ROC0-MAP.jpg) | ![[IMAGE] of](P_1x5R_014_C-100-noise-ROC0-HISTO.jpg) | MEAN = 4.044839SIGMA = 0.301852 |
| ROC1 NOISE | ![[IMAGE] of](P_1x5R_014_C-100-noise-ROC1-MAP.jpg) | ![[IMAGE] of](P_1x5R_014_C-100-noise-ROC1-HISTO.jpg) | MEAN = 4.436643SIGMA = 0.337981 |
| ROC2 NOISE | ![[IMAGE] of](P_1x5R_014_C-100-noise-ROC2-MAP.jpg) | ![[IMAGE] of](P_1x5R_014_C-100-noise-ROC2-HISTO.jpg) | MEAN = 3.909895SIGMA = 0.284882 |
| ROC3 NOISE | ![[IMAGE] of](P_1x5R_014_C-100-noise-ROC3-MAP.jpg) | ![[IMAGE] of](P_1x5R_014_C-100-noise-ROC3-HISTO.jpg) | MEAN = 4.519043SIGMA = 0.337403 |
| ROC4 NOISE | ![[IMAGE] of](P_1x5R_014_C-100-noise-ROC4-MAP.jpg) | ![[IMAGE] of](P_1x5R_014_C-100-noise-ROC4-HISTO.jpg) | MEAN = 5.449555SIGMA = 0.434824 |
Comment (if any): Okay.
This Device have been tested 0Times prior to this one and here are the links to the previous tests:End testing time: 4:32 PM