P_1x5R_001_A

Production testing

Date:10/24/2007

Operator: Ozhan Koybasi

start testing time:5:36 PM

Sensor: S_1x5R_00, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W49_D1LQG5T54C
ROC1W49_D1LQG5T25D
ROC2W49_D1LQG5T37B
ROC3W49_D1LQG5T37A
ROC4W49_D1LQG5T36D

Depletion Voltage is -48 and suggested operational voltage is -88
Ibias_DAC, Ibias_DAC Data 152 156 148 148 162
Vana, VanaData 153 148 135 141 145
CalDelData and plots8389848977
VthrCompData and plots8986898982
TestDdata ,TestD Plots011600
LightData ,Light Plots00000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe9510011010595
Vsf155150140140145
VoffsetOp115100100105105
VIbias_PH100959595100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 3.848774

SIGMA = 0.304355
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 3.945874

SIGMA = 0.325883
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.302380

SIGMA = 0.352570
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.356814

SIGMA = 0.330676
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 3.923200

SIGMA = 0.297764

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 6:04 PM