P_1x5L_175

P_1x5L_175_A

Production testing

Date:4/30/2007

Operator: Mia Tosi

start testing time:12:21 PM

Sensor: S_1x5L_17, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W28_X54K5TT 55A

ROC1 W33_XC4K5LT 14C

ROC2 W28_X54K5TT 56B

ROC3 W28_X54K5TT 54A

ROC4 W28_X54K5TT 53D

ROC	ROC wafer	Label
ROC0	W28_X54K5TT	55A
ROC1	W33_XC4K5LT	14C
ROC2	W28_X54K5TT	56B
ROC3	W28_X54K5TT	54A
ROC4	W28_X54K5TT	53D

Depletion Voltage is -48 and suggested operational voltage is -88

Ibias_DAC, Ibias_DAC Data 146 144 128 148 132

Vana, VanaData 139 138 109 129 138

CalDelData and plots 83 74 88 84 74

VthrCompData and plots 73 76 63 72 79

TestDdata ,TestD Plots 0 0 0 0 0

LightData ,Light Plots 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	110	115	165	130	115
Vsf	140	140	130	140	135
VoffsetOp	100	75	70	80	70
VIbias_PH	100	100	100	100	95

ROC0 NOISE			MEAN = 4.171244 SIGMA = 0.325227
ROC1 NOISE			MEAN = 4.561975 SIGMA = 0.354703
ROC2 NOISE			MEAN = 5.678911 SIGMA = 0.442001
ROC3 NOISE			MEAN = 4.696368 SIGMA = 0.373127
ROC4 NOISE			MEAN = 4.956462 SIGMA = 0.405803

Comment (if any): good

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:42 PM

Ibias_DAC, Ibias_DAC Data	146	144	128	148	132
Vana, VanaData	139	138	109	129	138
CalDelData and plots	83	74	88	84	74
VthrCompData and plots	73	76	63	72	79
TestDdata ,TestD Plots	0	0	0	0	0
LightData ,Light Plots	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD