P_1x5L_166

P_1x5L_166_C

Production testing

Date:3/22/2007

Operator: Joseph Clampitt

start testing time:11:21 AM

Sensor: S_1x5L_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XG4KFCT 13C

ROC1 XG4KFCT 11D

ROC2 XG4KFCT 06B

ROC3 XG4KFCT 06A

ROC4 XG4KFCT 05B

ROC	ROC wafer	Label
ROC0	XG4KFCT	13C
ROC1	XG4KFCT	11D
ROC2	XG4KFCT	06B
ROC3	XG4KFCT	06A
ROC4	XG4KFCT	05B

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 138 130 132 126 138

Vana, VanaData 120 121 132 122 142

CalDelData and plots 74 82 91 94 77

VthrCompData and plots 87 72 75 66 78

TestDdata ,TestD Plots 0 6 0 0 1

LightData ,Light Plots 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	155	135	120	105	95
Vsf	135	135	140	140	145
VoffsetOp	95	80	80	80	85
VIbias_PH	100	95	95	100	105

ROC0 NOISE			MEAN = 4.322874 SIGMA = 0.346060
ROC1 NOISE			MEAN = 5.102885 SIGMA = 0.400988
ROC2 NOISE			MEAN = 5.044813 SIGMA = 0.399719
ROC3 NOISE			MEAN = 5.179353 SIGMA = 0.409965
ROC4 NOISE			MEAN = 4.924721 SIGMA = 0.388368

Comment (if any): Good

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:40 AM

Ibias_DAC, Ibias_DAC Data	138	130	132	126	138
Vana, VanaData	120	121	132	122	142
CalDelData and plots	74	82	91	94	77
VthrCompData and plots	87	72	75	66	78
TestDdata ,TestD Plots	0	6	0	0	1
LightData ,Light Plots	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD