P_1x5L_163_C

Production testing

Date:5/8/2007

Operator: mia tosi

start testing time:11:31 AM

Sensor: S_1x5L_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0KNN0GDT52C
ROC1KNN0GDT32D
ROC2KNN0GDT42C
ROC3KNN0GDT22B
ROC4KNN0GDT12C

Depletion Voltage is -48 and suggested operational voltage is -88
Ibias_DAC, Ibias_DAC Data 144 146 134 140 148
Vana, VanaData 138 127 128 125 146
CalDelData and plots8478816877
VthrCompData and plots7378818182
TestDdata ,TestD Plots81100
LightData ,Light Plots141100
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe9511512014590
Vsf140140140140145
VoffsetOp9580607080
VIbias_PH105100110100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.517507

SIGMA = 0.359999
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.420899

SIGMA = 0.355457
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.382767

SIGMA = 0.417562
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.995226

SIGMA = 0.387904
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.656668

SIGMA = 0.376502

Comment (if any): look @ ROC0 corner

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:53 AM