P_1x5L_140

P_1x5L_140_C

Production testing

Date:6/28/2007

Operator: Emily Grace

start testing time:1:27 PM

Sensor: S_1x5L_14, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 DULQEDT 64A

ROC1 DULQEDT 03B

ROC2 DULQEDT 35A

ROC3 DULQEDT 55C

ROC4 DULQEDT 06C

ROC	ROC wafer	Label
ROC0	DULQEDT	64A
ROC1	DULQEDT	03B
ROC2	DULQEDT	35A
ROC3	DULQEDT	55C
ROC4	DULQEDT	06C

Depletion Voltage is -44 and suggested operational voltage is -84

Ibias_DAC, Ibias_DAC Data 152 156 150 150 158

Vana, VanaData 153 149 127 155 144

CalDelData and plots 82 77 99 80 91

VthrCompData and plots 92 92 78 91 89

TestDdata ,TestD Plots 1 1 1 0 41

LightData ,Light Plots 6 1 1 0 43

Pass/Fail TestD GOOD GOOD GOOD GOOD BAD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD BAD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	100	95	105	95	95
Vsf	150	145	140	150	145
VoffsetOp	110	125	85	115	120
VIbias_PH	105	100	95	95	100

ROC0 NOISE			MEAN = 4.241429 SIGMA = 0.318787
ROC1 NOISE			MEAN = 4.115753 SIGMA = 0.311419
ROC2 NOISE			MEAN = 4.267689 SIGMA = 0.338408
ROC3 NOISE			MEAN = 4.026363 SIGMA = 0.317320
ROC4 NOISE			MEAN = 3.973611 SIGMA = 0.301859

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 1:53 PM

Ibias_DAC, Ibias_DAC Data	152	156	150	150	158
Vana, VanaData	153	149	127	155	144
CalDelData and plots	82	77	99	80	91
VthrCompData and plots	92	92	78	91	89
TestDdata ,TestD Plots	1	1	1	0	41
LightData ,Light Plots	6	1	1	0	43
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	BAD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	BAD