P_1x5L_132

P_1x5L_132_A

Production testing

Date:7/3/2007

Operator: Emily Grace

start testing time:10:58 AM

Sensor: S_1x5L_13, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W45_D3LQFLT 44B

ROC1 W45_D3LQFLT 44A

ROC2 W45_D3LQFLT 43C

ROC3 W45_D3LQFLT 43A

ROC4 W45_D3LQFLT 41B

ROC	ROC wafer	Label
ROC0	W45_D3LQFLT	44B
ROC1	W45_D3LQFLT	44A
ROC2	W45_D3LQFLT	43C
ROC3	W45_D3LQFLT	43A
ROC4	W45_D3LQFLT	41B

Depletion Voltage is -42 and suggested operational voltage is -82

Ibias_DAC, Ibias_DAC Data 164 158 156 164 158

Vana, VanaData 134 140 141 134 158

CalDelData and plots 79 74 78 82 83

VthrCompData and plots 90 87 89 88 89

TestDdata ,TestD Plots 1 82 198 20 0

LightData ,Light Plots 0 0 0 0 0

Pass/Fail TestD GOOD BAD BAD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	115	90	100	95	90
Vsf	140	145	145	140	150
VoffsetOp	90	100	110	120	100
VIbias_PH	100	100	100	100	100

ROC0 NOISE			MEAN = 4.203401 SIGMA = 0.336569
ROC1 NOISE			MEAN = 4.215984 SIGMA = 0.354156
ROC2 NOISE			MEAN = 3.659781 SIGMA = 0.285905
ROC3 NOISE			MEAN = 3.874562 SIGMA = 0.298241
ROC4 NOISE			MEAN = 4.112697 SIGMA = 0.315400

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:24 AM

Ibias_DAC, Ibias_DAC Data	164	158	156	164	158
Vana, VanaData	134	140	141	134	158
CalDelData and plots	79	74	78	82	83
VthrCompData and plots	90	87	89	88	89
TestDdata ,TestD Plots	1	82	198	20	0
LightData ,Light Plots	0	0	0	0	0
Pass/Fail TestD	GOOD	BAD	BAD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD