P_1x5L_126

P_1x5L_126_C

Production testing

Date:6/1/2007

Operator: Emily Grace

start testing time:3:05 PM

Sensor: S_1x5L_12, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 KBNG0QT 41D

ROC1 KBNG0QT 21A

ROC2 KBNG0QT 21C

ROC3 KBNG0QT 20A

ROC4 KBNG0QT 11A

ROC	ROC wafer	Label
ROC0	KBNG0QT	41D
ROC1	KBNG0QT	21A
ROC2	KBNG0QT	21C
ROC3	KBNG0QT	20A
ROC4	KBNG0QT	11A

Depletion Voltage is -42 and suggested operational voltage is -82

Ibias_DAC, Ibias_DAC Data 162 158 140 162 154

Vana, VanaData 148 140 125 132 137

CalDelData and plots 75 65 73 84 86

VthrCompData and plots 89 83 81 81 82

TestDdata ,TestD Plots 0 0 0 1 1

LightData ,Light Plots 0 0 1 1 1

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	100	85	115	110	110
Vsf	145	140	140	140	140
VoffsetOp	120	85	70	100	105
VIbias_PH	95	95	95	100	95

ROC0 NOISE			MEAN = 3.836037 SIGMA = 0.288769
ROC1 NOISE			MEAN = 4.125620 SIGMA = 0.347704
ROC2 NOISE			MEAN = 4.350923 SIGMA = 0.344654
ROC3 NOISE			MEAN = 3.614259 SIGMA = 0.305331
ROC4 NOISE			MEAN = 4.023722 SIGMA = 0.312786

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 3:30 PM

Ibias_DAC, Ibias_DAC Data	162	158	140	162	154
Vana, VanaData	148	140	125	132	137
CalDelData and plots	75	65	73	84	86
VthrCompData and plots	89	83	81	81	82
TestDdata ,TestD Plots	0	0	0	1	1
LightData ,Light Plots	0	0	1	1	1
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD